8 Titel
zu den FilteroptionenPreparation and Characterization of Epitaxially Grown Unsupported Yttria-stabilized Zirconia (YSZ) Thin Films
Götsch, T. ; Mayr, L. ; Stöger-Pollach, M. ; Klötzer, B. ; Penner, S.In: Applied Surface Science, 331 (2015), S. 427-4362015The Crystallographic and Electronic Phase Diagrams of Yttria-Stabilized Zirconia Model Electrolytes
Götsch, T. ; Menzel, A. ; Bertel, E. ; Stöger-Pollach, M. ; Penner, S.In: ECS Transactions, 78 (2017), 1, S. 311-3192017Carbon tolerance of Ni-Cu and Ni-Cu/YSZ sub-[my]m sized SOFC thin film model systems
Götsch, T. ; Schachinger, T. ; Stöger-Pollach, M. ; Kaindl, R. ; Penner, S.In: Applied Surface Science, 402 (2017), S. 1-112017Distinct Carbon Growth Mechanisms on the Components of Ni/YSZ Materials
Kogler, M. ; Köck, E.-M. ; Stöger-Pollach, M. ; Schwarz, S. ; Schachinger, T. ; Klötzer, B. ; Penner, S.In: Materials Chemistry And Physics, 173 (2016), S. 508-5152016Ni-perovskite interaction and its structural and catalytic consequences in methane steam reforming and methanation reactions
Thalinger, R. ; Gocyla, M. ; Heggen, M. ; Dunin-Borkovski, R. ; Grünbacher, M. ; Stöger-Pollach, M. ; Schmidmair, D. ; Klötzer, B. ; Penner, S.In: Journal Of Catalysis, 337 (2016), S. 26-352016Rhodium-Catalyzed Methanation and Methane Steam Reforming Reactions on Rhodium-Perovskite Systems: Metal-Support Interaction
Thalinger, R. ; Götsch, T. ; Zhuo, C. ; Hetaba, W. ; Wallisch, W. ; Stöger-Pollach, M. ; Schmidmair, D. ; Klötzer, B. ; Penner, S.In: ChemCatChem, 8 (2016), 12, S. 2057-20672016Formation and Stability of small well-defined Cu- and Ni oxide particles
Thalinger, Ramona ; Heggen, M. ; Stroppa, D. ; Stöger-Pollach, M. ; Klötzer, Bernhard ; Penner, SimonIn: Materials Chemistry And Physics, 143 (2013), 1, S. 184-1942013Electron microscopy investigations of metal-support interaction effects in M/Y2O3 and M/ZrO2 thin films (M=Cu, Ni)
Thalinger, Ramona ; Stöger-Pollach, M. ; Hetaba, Walid ; Feuerbacher, M. ; Klötzer, Bernhard ; Penner, SimonIn: Materials Chemistry And Physics, 143 (2013), S. 167-1772013
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